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Surface Contamination Meter

Surface Contamination Meter
Surface Contamination Meter
Product Code : ACM-SCM-2637
Brand Name : Weiber
Product Description

 Surface Contamination Meter

There have been developed some classical methods for study of surfaces which are in use even today. These include adsorption isotherms, measurements of surface roughness, ellipsometry, reflectivity, and microscopy.

All real-world samples are contaminated as a result of atmospheric contact. A metal sample when kept in normal atmospheric conditions for an hour will attract a contamination layer of carbon on its surface. The easily oxidized metals get on their surface a contamination of oxide layer.

Importance of Contamination Control

  • Pharmaceuticals
  • Food Processing
  • Electronics
  • Surface Plating and coating


Categories of Surface Contaminants

  • Film Type surface contaminants
  • Particulate surface contaminant

 

Product Overview
Weiber Surface Contamination Meter is ideal equipment for research and general applications in the field of analysis of surface contamination. Our equipment measures alpha, beta, gamma and x-radiation using a 2-inch pancake GM Detector with high sensitivity to common beta and alpha sources.

The easy-to-read digital display shows readings in your choice of mR/hr, CPM, CPS, or mSv/hr. The Total/Timer feature allows timed readings from one minute to 24 hours for precise measurement of low-level contamination.


There have been developed some classical methods for study of surfaces which are in use even today. These include adsorption isotherms, measurements of surface roughness, ellipsometry, reflectivity, and microscopy.

 

All real-world samples are contaminated as a result of atmospheric contact. A metal sample when kept in normal atmospheric conditions for an hour will attract a contamination layer of carbon on its surface. The easily oxidized metals get on their surface a contamination of oxide layer.

 

Applications

  • Our equipment is of foremost importance in the following processes:
  • Research and Development
  • Manufacturing
  • Quality Control
  • Aerospace
  • Optics
  • Biomedical
  • Xerography

 

Surface cleanliness is essential when applying the replication methods; it is less significant when viewing the specimen directly by the scanning electron microscope. Surface damage any analytical measurement should not change the sample being measured. If the condition of the measurement or the probe with which the analysis is being done changes or damages the sample, the results of the analysis will be incorrect.


Temperature Range

  • -10 ºC to +50C (14 ºF to 122 ºF)
  • Power-One 9-volt alkaline battery; battery life is minimum 200 hours at normal background, minimum 24 hours at 1 mR / hr
  • Optional Accessories
  • Wipe Test Plate
  • External scintillation probe

 



ACMAS TECHNOLOGIES PVT. LTD.
507, Pearl Best Heights II, Pitampura,Delhi - 110034, India
Mr. Atul Badola (Director)
Mr. Saudan Singh (Director)
Ms. Komal Wadhwani (Marketing Manager)
Ms. Sonia Nathani
Mr. Jay Ram Patel (IT head)
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